SEM image analysis · IEEE Access (2025)
SEM Deep Learning Multiclass Noise Level Classification With Data Augmentation
- Problem
- SEM images lose quality under varying noise levels, which makes downstream inspection less reliable.
- Method
- Deep learning pipeline with augmentation for multiclass noise-level classification in SEM imaging.
- Result
- Published in IEEE Access in 2025 and listed on both IEEE Xplore and Google Scholar.
- Why it matters
- It turns image-quality assessment into something more systematic for semiconductor, materials, and microscopy workflows.